Dual lenses & oblique incidence optical system (DLOIS)_banner

Dual lenses & oblique incidence optical system (DLOIS)

Provide wide measuring range from 10 nm to 3500 μm

Innovation of Fourier optical system
DLOIS of Bettersize is a novel technology based on Fourier optical system. By an addition of the second lens at the symmetric path behind the sample cell, DLOIS can detect backward scattered laser light. The second lens also functions as a collimating lens which turns the diverging laser beam into parallel beam before the sample cell. The parallel beam impeding on the sample cell have the advantage of large and constant intensity circle of illumination of the samples inside the cell. In a laser diffraction measurement, the forward and backward diffraction lasers generated by a single laser source will have a consistent wavelength, datum, and continuity.

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Wide measuring range
DLOIS in Bettersizer S3 series can change laser beam from parallel to oblique when detecting a large angle; therefore, provides wide measuring range from 10 nm to 3500 μm and enlarges detection angle up to 165 degree. The calculation of particle size is complied with the Mie theory, achieving impressive precision and accuracy.

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The features of DLOIS:

‧The back lens is both the laser beam collimation lens and the backwards diffraction laser detecting lens.

‧Oblique incidence structure achieves the detecting angle of 0.02-165 degree and the measuring range of 0.01-3500 μm.

‧96 surrounded detectors on the dual-lens focal plane improve the resolution ratio and measuring accuracy.

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